E. Wohlrab

On the application of the Neuron MOS transistor principle for modern VLSI design

W. Weber, S.J. Prange, P. Thewes et al. · IEEE Transactions on Electron Devices · 1996 · 45 citations

Engineering, Computer Engineering, Electrical Engineering +17

Intra-die device parameter variations and their impact on digital CMOS gates at low supply voltages

Marc-Thomas Eisele, J. Berthold, R. Thewes et al. · 2002 · 32 citations

Engineering, Computer Engineering, Electrical Engineering +17

A physical lifetime prediction method for hot-carrier-stressed p-MOS transistors

M. Brox, E. Wohlrab, W. Weber · 2002 · 31 citations

Engineering, Electrical Engineering, Microelectronics +16

Experimental investigation of the minimum signal for reliable operation of DRAM sense amplifiers

H. Geib, E. Wohlrab, Lorenz Risch · IEEE Journal of Solid-State Circuits · 1992 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +13

A neuron MOS transistor-based multiplier cell

W. Weber, S.J. Prange, R. Thewes et al. · 2002 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +15