Bastien Mamdy

Industrialised SPAD in 40 nm technology

Sara Pellegrini, B. Rae, A. Pingault et al. · 2017 · 57 citations

Engineering, Electrical Engineering, Materials Science +10

MOS Capacitor Deep Trench Isolation for CMOS image sensors

Nabil Ahmed, F. Roy, G-N. Lu et al. · 2014 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +17

Proton-Induced Displacement Damages in 2-D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation

Ali Jouni, Mathieu Sicre, Victor Malherbe et al. · IEEE Transactions on Nuclear Science · 2023 · 15 citations · Full text

Engineering, Electrical Engineering, Photonics +14

Development of small-sized pixel structures for high-resolution CMOS image sensors

F. Roy, Bastien Mamdy, Nayera Ahmed et al. · 2017 · 12 citations

Engineering, Electrical Engineering, Microelectronics +16

Displacement Damage Characterization of CMOS Single-Photon Avalanche Diodes: Alpha-Particle and Fast-Neutron Measurements

Victor Malherbe, Serge De Paoli, Bastien Mamdy et al. · IEEE Transactions on Nuclear Science · 2021 · 11 citations

Engineering, Electrical Engineering, Electronic Materials +16