Statistics
Publications
3
Citations
58
H-Index
3
Active since
2013
Affiliations
Stanford University(Current)
Nabil Ahmed is an author at Stanford University specializing in radiological hazard identification, gate oxide thickness effects, and silicon.
Publications per year
2013–2022
3
3
MOS Capacitor Deep Trench Isolation for CMOS image sensors
Nabil Ahmed, F. Roy, G-N. Lu et al. · 2014 · 31 citations
Engineering, Computer Engineering, Electrical Engineering +17
Nabil Ahmed · Third Text · 2013 · 13 citations
Social Sciences, Environmental Policy, Environmental History +12
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