K. Satoh

High energy X-ray computed tomography for industrial applications

Shigeru IZUMI, S. Kamata, K. Satoh et al. · IEEE Transactions on Nuclear Science · 1993 · 53 citations

X-ray Spectroscopy, Engineering, Microscopy +20

MOS area sensor: Part II—Low-noise MOS area sensor with antiblooming photodiodes

S. Ohba, M. Nakai, H. Ando et al. · IEEE Transactions on Electron Devices · 1980 · 34 citations

Engineering, High-sensitivity 320, Mos Area Sensor +18

Full-chip vectorless dynamic power integrity analysis and verification against 100uV/100ps-resolution measurement

Shen Lin, Makoto Nagata, K. Shimazake et al. · 2004 · 33 citations

Hardware Security, Low-power Electronics, Electrical Engineering +13

MOS area sensor: Part I—Design consideration and performance of an n-p-n structure 484 × 384 element color MOS imager

N. Koike, I. Takemoto, K. Satoh et al. · IEEE Transactions on Electron Devices · 1980 · 30 citations

RFSIM: Reduced Fault Simulator

Toshirou Nishida, Shunsuke Miyamoto, Tokinori Kozawa et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1987 · 19 citations

Engineering, Computer Architecture, Dynamic Reduction Algorithm +17