IEEE Transactions on Electron Devices · 1980 · 30 citations · 2 references
EngineeringElectrical EngineeringOptoelectronicsSemiconductor DevicesSensorsCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyDetector TechnologyImage SensorsPhotodetectorsSemiconductor DetectorsDynamic RangeHorizontal ResolutionImage Sensor DesignPhotodetector Noise PerformancePhotodiode ArraysPhotodiode CircuitsSignal-to-noise RatioVertical Resolution
The design consideration and performance of an n-p-n structure 484 × 384 element MOS imager is described. The imager has a photodiode array and scanners separately integrated on different p wells. The horizontal scanner, consisting of bootstrapping type noninverting circuits, features high speed and low noise. The maximum scan rate of the scanner is ∼15 MHz. The vertical scanner, consisting of inverting circuits, has a wide dynamic operating range. It can operate stably under an intense illumination of ∼ 1500 1x. Analysis of the MOS switch with a photodiode is also carried out. The 484 × 384 imager has shown excellent performances: signal to fixed-pattern-noise ratio of 54 dB, horizontal resolution of 260 TV lines, vertical resolution of 350 TV lines, well-balanced spectral response, and antiblooming.
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An NPN structure 484 × 384 MOS imager for a single-chip color camera
N. Koike, I. Takemoto, Keigo Sato et al. · 1979 · 16 citations