T. Maurice

Wafer-scale integration of double gated WS₂-transistors in 300mm Si CMOS fab

Inge Asselberghs, Quentin Smets, T. Schram et al. · 2020 · 50 citations

Electrical Engineering, Wafer Scale Processing, Engineering +12

Optical Properties of Bismuth Telluride Thin Films, Bi2Te3/Si(100) and Bi2Te3/SiO2/Si(100)

El. H. Kaddouri, T. Maurice, X. Gratens et al. · physica status solidi (a) · 1999 · 29 citations

Scaling of double-gated WS₂ FETs to sub-5nm physical gate length fabricated in a 300mm FAB

Quentin Smets, T. Schram, Devin Verreck et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 27 citations

Semiconductor Technology, Electrical Engineering, Engineering +11

The effect of order and dose of H and He sequential implantation on defect formation and evolution in silicon

P. Nguyen, K.K. Bourdelle, T. Maurice et al. · Journal of Applied Physics · 2007 · 17 citations

Engineering, Silicon On Insulator, Defect Tolerance +16

Raman and photoluminescence spectroscopy from n- and p-type 6H-SIC alpha-particle irradiated

H.W. Kunert, T. Maurice, J. Barnaś et al. · Vacuum · 2005 · 16 citations

P-type 6H-sic Alpha-particle, Photoluminescence, Physics +5