Young-Shying Chen

Modeling of hot-carrier-stressed characteristics of nMOSFETs

Young-Shying Chen, Tz-Hua Tang, Sheng‐Lyang Jang · Solid-State Electronics · 1996 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +12

Testing MRAM for Write Disturbance Fault

Chin-Lung Su, Chih-Wea Tsai, Cheng‐Wen Wu et al. · 2006 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +15

Demonstration of Lateral IGBTs in 4H-SiC

Kuan-Wei Chu, Wen-Shan Lee, Chi-Yin Cheng et al. · IEEE Electron Device Letters · 2013 · 20 citations

Engineering, Electrical Engineering, Materials Science +16

Write Disturbance Modeling and Testing for MRAM

Chin-Lung Su, Chih-Wea Tsai, Cheng‐Wen Wu et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2008 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +16

Wide operation margin of toggle mode switching for magnetic random access memory with preceding negative pulse writing scheme

Chien‐Ching Hung, Yuan-Jen Lee, Ming‐Jer Kao et al. · Applied Physics Letters · 2006 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +12