V. Lebedev

Determination of the anisotropic dielectric function for wurtzite AlN and GaN by spectroscopic ellipsometry

S. Shokhovets, R. Goldhahn, G. Gobsch et al. · Journal of Applied Physics · 2003 · 105 citations

Aluminium Nitride, Wide-bandgap Semiconductor, Optical Materials +17

Effect of dislocations on electrical and electron transport properties of InN thin films. II. Density and mobility of the carriers

V. Lebedev, V. Cimalla, Tommy Baumann et al. · Journal of Applied Physics · 2006 · 83 citations

Engineering, Semiconductors, Layer Thickness +17

AlGaN/GaN biosensor—effect of device processing steps on the surface properties and biocompatibility

I. Cimalla, Florentina Will, Katja Tonisch et al. · Sensors and Actuators B Chemical · 2006 · 80 citations

Engineering, Nanotechnology, Surface Science +6

Pt/GaN Schottky diodes for hydrogen gas sensors

Muhammad Ali, V. Cimalla, V. Lebedev et al. · Sensors and Actuators B Chemical · 2005 · 73 citations

Electrical Engineering, Engineering, Pt/gan Schottky Diodes +6

Surface Morphology and Microstructure of Pulsed DC Magnetron Sputtered Piezoelectric AlN and AlScN Thin Films

Yuan Lu, Markus Reusch, Nicolas Kurz et al. · physica status solidi (a) · 2017 · 73 citations

Materials Science, Aluminium Nitride, Engineering +13