J. Mitsuhashi

Mechanical stress and hydrogen effects on hot carrier injection

J. Mitsuhashi, Satoshi Nakao, Takashi Matsukawa · 1986 · 26 citations

Engineering, Electrical Engineering, Materials Science +17

Mechanism of negative-bias temperature instability in polycrystalline-silicon thin film transistors

S. Maeda, S. Maegawa, T. Ippōshi et al. · Journal of Applied Physics · 1994 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

Si/SiO2 interface states and neutral oxide traps induced by surface microroughness

M. Kimura, J. Mitsuhashi, Hiroshi Koyama · Journal of Applied Physics · 1995 · 22 citations

Engineering, Materials Engineering, Materials Science +17

Fabrication of Storage Capacitance-Enhanced Capacitors with a Rough Electrode

Y. Hayashide, Hiroshi Miyatake, J. Mitsuhashi et al. · Japanese Journal of Applied Physics · 1990 · 21 citations

Engineering, Electrical Engineering, Materials Science +16

Stress-induced current in nitride and oxidized nitride thin films

M.K. Mazumder, K. Kobayashi, J. Mitsuhashi et al. · IEEE Transactions on Electron Devices · 1994 · 15 citations

Engineering, Electrical Engineering, Materials Science +17