Yongkang Xue

On the Understanding of pMOS NBTI Degradation in Advance Nodes: Characterization, Modeling, and Exploration on the Physical Origin of Defects

Yongkang Xue, Pengpeng Ren, Junjie Wu et al. · IEEE Transactions on Electron Devices · 2023 · 20 citations

Engineering, Hk Layer, Physical Origin +21

Deep Understanding of Reliability in Hf-based FeFET during Bipolar Pulse Cycling: Trap Profiling for Read-After-Write Delay and Memory Window Degradation

Puyang Cai, Tianxiang Zhu, Jiahui Duan et al. · 2022 International Electron Devices Meeting (IEDM) · 2022 · 17 citations · Full text

Reliability Issues, Magnetism, Electrical Engineering +14

Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence

Zuoyuan Dong, Zixuan Sun, Xin Yang et al. · 2023 · 17 citations

A strong physical unclonable function with machine learning immunity for Internet of Things application

Pengpeng Ren, Yongkang Xue, Linglin Jing et al. · Science China Information Sciences · 2023 · 10 citations