Zirui Wang

Understanding Hot Carrier Reliability in FinFET Technology from Trap-based Approach

Runsheng Wang, Zixuan Sun, Yue‐Yang Liu et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 34 citations

Investigation of the Off-State Degradation in Advanced FinFET Technology—Part I: Experiments and Analysis

Zixuan Sun, Zirui Wang, Runsheng Wang et al. · IEEE Transactions on Electron Devices · 2023 · 20 citations

Electrical Engineering, Engineering, Hardware Reliability +14

On the Understanding of pMOS NBTI Degradation in Advance Nodes: Characterization, Modeling, and Exploration on the Physical Origin of Defects

Yongkang Xue, Pengpeng Ren, Junjie Wu et al. · IEEE Transactions on Electron Devices · 2023 · 20 citations

Engineering, Hk Layer, Physical Origin +21

Atomistic mechanisms of SiC electrochemical mechanical polishing in aqueous H2O2: A ReaxFF molecular dynamics study

Rui Zhu, Tianyu Zhang, Qingyu Yao et al. · Journal of Manufacturing Processes · 2025 · 19 citations

Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence

Zuoyuan Dong, Zixuan Sun, Xin Yang et al. · 2023 · 17 citations