J.F. Prairie

Heavy-ion broad-beam and microprobe studies of single-event upsets in 0.20-/spl mu/m SiGe heterojunction bipolar transistors and circuits

Robert A. Reed, Paul W. Marshall, J.C. Pickel et al. · IEEE Transactions on Nuclear Science · 2003 · 69 citations

Engineering, Vlsi Design, Single-event Upsets +17

Self-Aligned InP DHBT with<tex>$f_tau$</tex>and<tex>$f_max$</tex>Over 300 GHz in a New Manufacturable Technology

Gang He, J. K. Howard, P. Partyka et al. · IEEE Electron Device Letters · 2004 · 57 citations

Electrical Engineering, Engineering, Rf Semiconductor +10

A 20 GS/s 5-Bit SiGe BiCMOS Dual-Nyquist Flash ADC With Sampling Capability up to 35 GS/s Featuring Offset Corrected Exclusive-Or Comparators

R.A. Kertis, Jim S. Humble, Mary A. Daun-Lindberg et al. · IEEE Journal of Solid-State Circuits · 2009 · 23 citations

Electrical Engineering, Engineering, Data Converter +11

Ka-Band SiGe HBT Power Amplifier for Single-Chip T/R Module Applications

P.J. Riemer, J. S. Humble, J.F. Prairie et al. · IEEE MTT-S International Microwave Symposium digest · 2007 · 15 citations

Electrical Engineering, Millimeter Wave Technology, Engineering +12

A 35 GS/s 5-Bit SiGe BiCMOS flash ADC with offset corrected exclusive-or comparator

R.A. Kertis, J. S. Humble, Mary A. Daun-Lindberg et al. · 2008 · 13 citations

5-Bit Sige Adc, Exclusive-or Comparator, Electrical Engineering +11