Bálint Fodor

Approaches to calculate the dielectric function of ZnO around the band gap

Emil Agócs, Bálint Fodor, Beatrix Pollakowski et al. · Thin Solid Films · 2014 · 30 citations

Dielectric Function, Electrical Engineering, Engineering +6

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

Bálint Fodor, Thomas Defforge, Emil Agócs et al. · Applied Surface Science · 2016 · 24 citations

Materials Science, Engineering, Nanoporous Material +11

Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study

Bálint Fodor, Emil Agócs, Benjamin Bardet et al. · Microporous and Mesoporous Materials · 2016 · 23 citations · Full text

Materials Science, Surface Characterization, Thickness Characterization +7

Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method

Bálint Fodor, P. Kozma, Sven Burger et al. · Thin Solid Films · 2016 · 21 citations · Full text

Numerical Analysis, Finite Element Method, Engineering +10

Fourier ellipsometry – an ellipsometric approach to Fourier scatterometry

P. Petrík, Nitish Kumar, M. Fried et al. · Journal of the European Optical Society Rapid Publications · 2015 · 16 citations · Full text

Optical System Analysis, Engineering, Physics +13