Beatrix Pollakowski

A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Janin Lubeck, Burkhard Beckhoff, R. Fliegauf et al. · Review of Scientific Instruments · 2013 · 111 citations

Natural Sciences, Chemistry, Analytical Chemistry +16

High accuracy experimental determination of copper and zinc mass attenuation coefficients in the 100 eV to 30 keV photon energy range

Yves Ménesguen, Martin Gerlach, Beatrix Pollakowski et al. · Metrologia · 2015 · 39 citations · Full text

Natural Sciences, Chemistry, Analytical Chemistry +13

Reference-free grazing incidence x-ray fluorescence and reflectometry as a methodology for independent validation of x-ray reflectometry on ultrathin layer stacks and a depth-dependent characterization

Philipp Hönicke, Blanka Detlefs, Emmanuel Nolot et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2019 · 36 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Chemical character of BC _x N _y layers grown by CVD with trimethylamine borane

Olaf Baake, P. Hoffmann, Andreas Klein et al. · X-Ray Spectrometry · 2008 · 30 citations

Natural Sciences, Materials Engineering, Materials Science +14

Approaches to calculate the dielectric function of ZnO around the band gap

Emil Agócs, Bálint Fodor, Beatrix Pollakowski et al. · Thin Solid Films · 2014 · 30 citations

Natural Sciences, Materials Engineering, Materials Science +14