Concepedia

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

Bálint Fodor, Thomas Defforge, Emil Agócs, M. Fried, Gaël Gautier, P. Petrík

Applied Surface Science · 2016 · 25 citations · 37 references

DOI

Concepts

References

37

Ellipsometry and polarized light

R. M. A. Azzam, N. M. Bashara, D. Thorburn Burns · Analytica Chimica Acta · 1987 · 1.7K citations

, , +9

Optical properties of thin films

D. E. Aspnes · Thin Solid Films · 1982 · 1.6K citations

, , +14

Dielectric constants of heterogeneous mixtures

H. Looyenga · Physica · 1965 · 1.3K citations

, , +10

The dielectric constant of a composite material—A problem in classical physics

David J. Bergman · Physics Reports · 1978 · 1.1K citations

, , +14

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Craig M. Herzinger, Blaine Johs, William A. McGahan et al. · Journal of Applied Physics · 1998 · 1.1K citations

, , +17