Concepedia

Publication | Closed Access

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

DOI

24

Citations

37

References

2016

Year

Bálint Fodor, Thomas Defforge, Emil Agócs, M. Fried, Gaël Gautier, P. Petrík
Applied Surface Science

References

YearCitations

Page 1