Concepedia

Publication | Open Access

Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study

DOIFull Paper Access

23

Citations

26

References

2016

Year

Bálint Fodor, Emil Agócs, Benjamin Bardet, Thomas Defforge, F. Cayrel, Daniel Alquier, M. Fried, Gaël Gautier, P. Petrík
Microporous and Mesoporous Materials

References

YearCitations

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