Keitaro Imai

Leakage Current Mechanism of Amorphous and Polycrystalline Ta2 O 5 Films Grown by Chemical Vapor Deposition

Tomonori Aoyama, S. Saida, Y. Okayama et al. · Journal of The Electrochemical Society · 1996 · 86 citations

Materials Science, Electrical Engineering, Poole‐frenkel Type Leakage +13

Nonplanar oxidation and reduction of oxide leakage currents at silicon corners by rounding-off oxidation

Kikuo Yamabe, Keitaro Imai · IEEE Transactions on Electron Devices · 1987 · 79 citations

Engineering, Integrated Circuits, Silicon On Insulator +17

Density relaxation of silicon dioxide on (100) silicon during thermal annealing

Kenji Taniguchi, Masakazu Tanaka, Chihiro Hamaguchi et al. · Journal of Applied Physics · 1990 · 64 citations

Materials Science, Materials Engineering, Engineering +15

Variations in reactivity of lone-pair electrons due to intramolecular hydrogen bonding as observed by Penning ionization electron spectroscopy

Koichi Ohno, Keitaro Imai, Yoshiya Harada · Journal of the American Chemical Society · 1985 · 44 citations

Chemical Engineering, Lone-pair Electrons, Engineering +14

Penning ionization electron spectroscopy of nitriles

Koichi Ohno, Setsuo Matsumoto, Keitaro Imai et al. · The Journal of Physical Chemistry · 1984 · 43 citations

Engineering, Atomic Emission Spectroscopy, Altmetric Attention Score +18