Davit Melkonyan

Toward accurate composition analysis of GaN and AlGaN using atom probe tomography

R. J. H. Morris, Ramya Cuduvally, Davit Melkonyan et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2018 · 31 citations · Full text

Materials Science, Aluminium Nitride, Wide-bandgap Semiconductor +14

Self Focusing SIMS: Probing thin film composition in very confined volumes

Alexis Franquet, Bastien Douhard, Davit Melkonyan et al. · Applied Surface Science · 2016 · 28 citations

Optical Materials, Engineering, Physics +11

Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives

Jean‐Paul Barnes, Adeline Grenier, Isabelle Mouton et al. · Scripta Materialia · 2017 · 25 citations

Engineering, Microscopy, Magnetic Resonance +16

Atom probe tomography analysis of SiGe fins embedded in SiO 2 : Facts and artefacts

Davit Melkonyan, Claudia Fleischmann, L. Arnoldi et al. · Ultramicroscopy · 2017 · 24 citations · Full text

Sio 2, Engineering, Physics +10

Atom probe of GaN/AlGaN heterostructures: The role of electric field, sample crystallography and laser excitation on quantification

R. J. H. Morris, Ramya Cuduvally, Davit Melkonyan et al. · Ultramicroscopy · 2019 · 22 citations

Wide-bandgap Semiconductor, Engineering, Physics +8