Byung-Jin Cho

Quasi-breakdown of ultrathin gate oxide under high field stress

Seok‐Hee Lee, Byung-Jin Cho, Jong‐Choul Kim et al. · 2002 · 119 citations

Engineering, Electrical Engineering, Physics +17

Negative Bias Temperature Instability on Plasma-Nitrided Silicon Dioxide Film

Chew-Hoe Ang, Chun-Meng Lek, Shyue-Seng Tan et al. · Japanese Journal of Applied Physics · 2002 · 28 citations

Engineering, Electrical Engineering, Physics +16

Run-to-Run Overlay Control of Steppers in Semiconductor Manufacturing Systems Based on History Data Analysis and Neural Network Modeling

Seong‐Jik Park, M.-S. Lee, Sung‐Young Shin et al. · IEEE Transactions on Semiconductor Manufacturing · 2005 · 23 citations

Engineering, Industrial Engineering, Manufacturing Engineering +13

GaN metal–semiconductor–metal UV sensor with multi-layer graphene as Schottky electrodes

Chang‐Ju Lee, Sang-Bum Kang, Hyeon-Gu Cha et al. · Japanese Journal of Applied Physics · 2015 · 20 citations

Engineering, Materials Engineering, Materials Science +16

Demonstration of $L_{g} \sim \hbox{55}\ \hbox{nm}$ pMOSFETs With $\hbox{Si/Si}_{0.25}\hbox{Ge}_{0.75}/\hbox{Si}$ Channels, High $I_{\rm on}/I_{\rm off}\ (≫ \hbox{5} \times \hbox{10}^{4})$ , and Controlled Short Channel Effects (SCEs)

Se‐Hoon Lee, Prashant Majhi, Jungwoo Oh et al. · IEEE Electron Device Letters · 2008 · 19 citations

Engineering, Electrical Engineering, Microelectronics +13