I. Schanstra

Defect-based delay testing of resistive vias-contacts a critical evaluation

K. Baker, G. Gronthoud, M. Lousberg et al. · 2003 · 129 citations

Engineering, Computer Engineering, Electrical Engineering +14

Address and data scrambling: causes and impact on memory tests

A.J. van de Goor, I. Schanstra · 2003 · 80 citations

Engineering, Computer Engineering, Electrical Engineering +15

Industrial evaluation of stress combinations for march tests applied to SRAMs

I. Schanstra, A.J. van de Goor · 2003 · 33 citations

Engineering, Computer Engineering, Electrical Engineering +15

An effective BIST scheme for ring-address type FIFOs

Y. Zorian, A.J. van de Goor, I. Schanstra · 2002 · 31 citations

Engineering, Computer Engineering, Computer Science +13

Semiconductor manufacturing process monitoring using built-in self-test for embedded memories

I. Schanstra, D. Lukita, A.J. van de Goor et al. · 2002 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +13