J. Hui

Specific contact resistivity of TiSi₂to P⁺and n⁺junctions

J. Hui, S.S. Wong, J.L. Moll · IEEE Electron Device Letters · 1985 · 44 citations

Engineering, Electrical Engineering, Materials Science +17

A new substrate and gate current phenomenon in short-channel LDD and minimum overlap devices

J. Hui, Fu‐Lan Hsu, J.L. Moll · IEEE Electron Device Letters · 1985 · 32 citations

Engineering, Electrical Engineering, Microelectronics +14

Effect of final annealing on hot-electron-induced MOSFET degradation

Fu‐Lan Hsu, J. Hui, K.Y. Chiu · IEEE Electron Device Letters · 1985 · 29 citations

Engineering, Electrical Engineering, Materials Science +16

Selective oxidation technologies for high density MOS

J. Hui, T.-Y. Chiu, S.S. Wong et al. · IEEE Electron Device Letters · 1981 · 29 citations

Engineering, Materials Engineering, Materials Science +17

Submicrometer device design for hot-electron reliability and performance

J. Hui, J.L. Moll · IEEE Electron Device Letters · 1985 · 19 citations

Engineering, Electrical Engineering, Microelectronics +11