Patrick Whiting

SnO2 functionalized AlGaN/GaN high electron mobility transistor for hydrogen sensing applications

Shao-Tsu Hung, Chi‐Jung Chang, Chien-Hsing Hsu et al. · International Journal of Hydrogen Energy · 2012 · 61 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +6

AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress

E Douglas, Chin‐Wei Chang, David Cheney et al. · Microelectronics Reliability · 2010 · 35 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +4

Reverse gate bias-induced degradation of AlGaN/GaN high electron mobility transistors

Chih-Yang Chang, Travis J. Anderson, Jennifer K. Hite et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2010 · 26 citations

Wide-bandgap Semiconductor, Semiconductor Technology, Electrical Engineering +9

Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contacts

Patrick Whiting, Nicholas G. Rudawski, M. R. Holzworth et al. · Microelectronics Reliability · 2017 · 18 citations

Materials Science, Wide-bandgap Semiconductor, Electrical Engineering +10

Under-gate defect formation in Ni-gate AlGaN/GaN high electron mobility transistors

Patrick Whiting, S. J. Pearton, K. S. Jones et al. · Microelectronics Reliability · 2012 · 13 citations

Semiconductor Technology, Wide-bandgap Semiconductor, Electrical Engineering +5