Peter Thomsen-Schmidt

Author

Physikalisch-Technische Bundesanstalt

Also Known As

P Thomsen-Schmidt, P. Thomsen-Schmidt, P. Thomsen‐Schmidt, Peter Thomsen-Schmidt

Publications

206

Citations

H-Index

Concepts

All Affiliations

Physikalisch-Technische Bundesanstalt Technische Universität Berlin Federal Institute For Materials Research and Testing Fraunhofer Institute for Material and Beam Technology

About

Peter Thomsen-Schmidt is an author at Physikalisch-Technische Bundesanstalt specializing in engineering, applied physics, and thin films.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	6	6	122
2	Applied Physics	3	3	60
3	Education	1	1	22
4	Natural Sciences	1	1	24
5	Civil Engineering	1	1	22

Peter Thomsen-Schmidt

Publications

132

Citations

H-Index

Page 1

	Year	Citations
Thickness determination for SiO2 films on Si by X-ray reflectometry at the Si K edge Michael Krumrey, Michael Hoffmann, G. Ulm, Thin Solid Films Materials ScienceSi K EdgeEngineeringSurface ScienceApplied Physics	2004	28
Reconstructing surface profiles from curvature measurements Clemens Elster, Joachim Gerhardt, Peter Thomsen-Schmidt, Optik Geometric ModelingEngineeringGeometryNatural SciencesSurface Profiles	2002	24
Characterization of a traceable profiler instrument for areal roughness measurement Peter Thomsen-Schmidt Measurement Science and Technology Roughness MeasurementEngineeringMeasurementMechanical EngineeringEducation	2011	22
Laser-induced nucleation of crystals in amorphous Ge films O. Bostanjoglo, W. Marine, Peter Thomsen-Schmidt Applied Surface Science Laser-induced NucleationEngineeringOptical PropertiesApplied PhysicsPulsed Laser Deposition	1992	18
Realisation and metrological characterisation of thickness standards below 100�nm Peter Thomsen-Schmidt, G. Ulm, Konrad Herrmann, Applied Physics A Precision MeasurementEngineeringNondestructive TestingMeasurementMechanical Engineering	2004	16
Metrological characterization of nanometer film thickness standards for XRR and ellipsometry applications Klaus Hasche, Peter Thomsen-Schmidt, Michael Krumrey, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE X-ray SpectroscopyEllipsometry ApplicationsEngineeringThin Film Process TechnologyX-ray Fluorescence	2003	14
Laser-induced multiple phase transitions in GeTe films traced by time-resolved TEM O. Bostanjoglo, Peter Thomsen-Schmidt Applied Surface Science	1989	10

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