Peter Thomsen-Schmidt

Thickness determination for SiO2 films on Si by X-ray reflectometry at the Si K edge

Michael Krumrey, Michael Hoffmann, G. Ulm et al. · Thin Solid Films · 2004 · 28 citations

Materials Science, Si K Edge, Engineering +9

Reconstructing surface profiles from curvature measurements

Clemens Elster, Joachim Gerhardt, Peter Thomsen-Schmidt et al. · Optik · 2002 · 24 citations

Geometric Modeling, Engineering, Geometry +8

Characterization of a traceable profiler instrument for areal roughness measurement

Peter Thomsen-Schmidt · Measurement Science and Technology · 2011 · 22 citations

Roughness Measurement, Engineering, Measurement +22

Laser-induced nucleation of crystals in amorphous Ge films

O. Bostanjoglo, W. Marine, Peter Thomsen-Schmidt · Applied Surface Science · 1992 · 18 citations

Laser-induced Nucleation, Engineering, Optical Properties +5

Realisation and metrological characterisation of thickness standards below 100�nm

Peter Thomsen-Schmidt, G. Ulm, Konrad Herrmann et al. · Applied Physics A · 2004 · 16 citations

Precision Measurement, Engineering, Nondestructive Testing +4