Michael Krumrey - Concepedia

Author

Michael Krumrey

Physikalisch-Technische Bundesanstalt ORCID

Also Known As

Krumrey M., Krumrey, Michael, M Krumrey, M. Krumrey, Michael K. Krumrey, Michael Krumrey

323

Publications

7.1K

Citations

H-Index

198

Concepts

All Affiliations

Physikalisch-Technische Bundesanstalt European Space Research and Technology Centre Cosine (Netherlands)Max Planck Institute for Extraterrestrial Physics Micronit Microfluidics (Netherlands)

About

Michael Krumrey is an author at Physikalisch-Technische Bundesanstalt specializing in engineering, applied physics, and instrumentation.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	35	115	4K
2	Health Sciences	19	36	1.3K
3	Natural Sciences	14	17	554
4	Medicine	8	8	229
5	Education	4	4	324

Michael Krumrey

164

Publications

6.1K

Citations

H-Index

Page 1

	Year	Citations
Mechanical Stability and Fibrinolytic Resistance of Clots Containing Fibrin, DNA, and Histones Colin Longstaff, Imre Varjú, Péter Sótonyi, Journal of Biological Chemistry	2013	281
Towards traceable size determination of extracellular vesicles Zoltán Varga, Yuana Yuana, Anita E. Grootemaat, Journal of Extracellular Vesicles	2014	238
High-accuracy detector calibration at the PTB four-crystal monochromator beamline Michael Krumrey, G. Ulm Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Sensor CalibrationEngineeringRadiation DetectionHigh-accuracy Detector CalibrationMeasurement	2001	201
BAMline: the first hard X-ray beamline at BESSY II W. Görner, Manfred Hentschel, Bernd R. Müller, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment EngineeringBessy IiCosmic RaySynchrotron RadiationX-ray Optic	2001	200
Counting the atoms in a<sup>28</sup>Si crystal for a new kilogram definition Birk Andreas, Yasushi Azuma, Guido Bartl, Metrologia	2011	184
Gas detectors for x-ray lasers K. Tiedtke, J. Feldhaus, Ulrich Hahn, Journal of Applied Physics EngineeringDifferent TypesHigh-power LasersElectron OpticX-ray Imaging	2008	177
Critical review of the current status of thickness measurements for ultrathin SiO <sub>2</sub> on Si Part V: Results of a CCQM pilot study M. P. Seah, Steven J. Spencer, Farid Bensebaa, Surface and Interface Analysis	2004	139
Multilayer x-ray mirrors: Interfacial roughness, scattering, and image quality Eberhard Spiller, D. G. Stearns, Michael Krumrey Journal of Applied Physics Materials ScienceSurface CharacterizationOptical MaterialsEngineeringMultilayer Coatings	1993	137
A quarter‐century of metrology using synchrotron radiation by PTB in Berlin Burkhard Beckhoff, Alexander Gottwald, R. Klein, physica status solidi (b) X-ray SpectroscopyEngineeringMeasurementSynchrotron Radiation SourceX-ray Fluorescence	2009	130
Indications of radiation damage in ferredoxin microcrystals using high-intensity X-FEL beams Karol Nass, L. Foucar, Thomas R. M. Barends, Journal of Synchrotron Radiation X-ray CrystallographyX-ray SpectroscopyEngineeringMolecular BiologySynchrotron Radiation Source	2015	125

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