Brian R. Wier

A 0.8 THz $f_{\rm MAX}$ SiGe HBT Operating at 4.3 K

Partha Sarathi Chakraborty, Adilson S. Cardoso, Brian R. Wier et al. · IEEE Electron Device Letters · 2014 · 68 citations

Semiconductors, Thz Photonics, Electrical Engineering +14

Operation of SiGe HBTs Down to 70 mK

Hanbin Ying, Brian R. Wier, Jason Dark et al. · IEEE Electron Device Letters · 2016 · 35 citations

Electrical Engineering, Sige Hbt, Engineering +14

Large-Signal Reliability Analysis of SiGe HBT Cascode Driver Amplifiers

Michael A. Oakley, Uppili S. Raghunathan, Brian R. Wier et al. · IEEE Transactions on Electron Devices · 2015 · 33 citations

Reliability, Device Modeling, Electrical Engineering +14

A Comparison of Field and Current-Driven Hot-Carrier Reliability in NPN SiGe HBTs

Brian R. Wier, Uppili S. Raghunathan, Partha Sarathi Chakraborty et al. · IEEE Transactions on Electron Devices · 2015 · 23 citations

Engineering, Semiconductor Device, Unexpected Stress +17

Bias- and Temperature-Dependent Accumulated Stress Modeling of Mixed-Mode Damage in SiGe HBTs

Uppili S. Raghunathan, Partha Sarathi Chakraborty, Tikurete G. Bantu et al. · IEEE Transactions on Electron Devices · 2015 · 22 citations

Engineering, Degradation Model, Electrical Stress Bias +17