Varsha Balakrishnan

Optimized Circuit Failure Prediction for Aging: Practicality and Promise

Manu Agarwal, Varsha Balakrishnan, Anshuman Bhuyan et al. · 2008 · 140 citations

Engineering, Vlsi Design, Flip-flop Designs +16

Statistical prediction of circuit aging under process variations

Wenping Wang, Vijay Reddy, Bo Yang et al. · 2008 · 79 citations

Engineering, Aging, Transistor Degradation +17

On the efficacy of input Vector Control to mitigate NBTI effects and leakage power

Yu Wang, Wenping Wang, Varsha Balakrishnan et al. · 2009 · 73 citations

Engineering, Vlsi Design, Technology Scales +18

Circuit aging prediction for low-power operation

Rui Zheng, Jyothi Velamala, Vijay Reddy et al. · 2009 · 60 citations

Hardware Security, Electrical Engineering, Reliability Engineering +14

New-Age: A Negative Bias Temperature Instability-Estimation Framework for Microarchitectural Components

Michael DeBole, Ramakrishnan Krishnan, Varsha Balakrishnan et al. · International Journal of Parallel Programming · 2009 · 16 citations

Engineering, Hardware Reliability, Uncertainty Quantification +9