Xiaojuan Lian

Robust memristors based on layered two-dimensional materials

Miao Wang, Songhua Cai, Chen Pan et al. · Nature Electronics · 2018 · 763 citations · Full text

Electrical Engineering, Engineering, Nanoelectronics +6

Quantum-size effects in hafnium-oxide resistive switching

Shibing Long, Xiaojuan Lian, C. Cagli et al. · Applied Physics Letters · 2013 · 165 citations · Full text

Materials Science, Engineering, Physics +14

Voltage and Power-Controlled Regimes in the Progressive Unipolar RESET Transition of HfO2-Based RRAM

Shibing Long, L. Perniola, C. Cagli et al. · Scientific Reports · 2013 · 148 citations · Full text

A Model for the Set Statistics of RRAM Inspired in the Percolation Model of Oxide Breakdown

Shibing Long, Xiaojuan Lian, C. Cagli et al. · IEEE Electron Device Letters · 2013 · 131 citations

Electrical Engineering, Engineering, Physics +15

Boron nitride as two dimensional dielectric: Reliability and dielectric breakdown

Yanfeng Ji, Chengbin Pan, Meiyun Zhang et al. · Applied Physics Letters · 2016 · 117 citations · Full text

Materials Engineering, Electrical Engineering, Boron Nitride +14