Concepedia
Statistics
Publications
5
Citations
96
H-Index
Active since
2015
Affiliations
Toray Industries, Inc. (Japan)(Current)
Showa Denko (Japan)
National Institute of Advanced Industrial Science and Technology
T. Naijo is an author at Toray Industries, Inc. (Japan) specializing in applied physics, engineering, and materials engineering.
Top concepts
EngineeringApplied PhysicsMaterials EngineeringElectrical EngineeringCrystalline DefectsStructural AnalysisPhysicsThin FilmsMicrostructureSolid Mechanics
Publications per year
2015–2018
Origin analysis of expanded stacking faults by applying forward current to 4H-SiC p–i–n diodes
Shohei Hayashi, T. Naijo, Tamotsu Yamashita et al. · Applied Physics Express · 2017 · 28 citations
Semiconductor Technology, Electrical Engineering, Origin Analysis +14
Structural analysis of double-layer Shockley stacking faults formed in heavily-nitrogen-doped 4H-SiC during annealing
Yuichiro Tokuda, Takako Yamashita, I. Kamata et al. · Journal of Applied Physics · 2017 · 26 citations
Materials Science, Engineering, Expansion Behavior +13
Characterization of double Shockley-type stacking faults formed in lightly doped 4H-SiC epitaxial films
Takako Yamashita, Shohei Hayashi, T. Naijo et al. · Journal of Crystal Growth · 2018 · 16 citations
Materials Engineering, Electrical Engineering, Engineering +6
Characteristic morphologies of triangular defects on Si-face 4H-SiC epitaxial films
Takako Yamashita, T. Naijo, Hirofumi Matsuhata et al. · Journal of Crystal Growth · 2015 · 14 citations
Structural analysis of the 3C|4H boundaries formed on prismatic planes in 4H-SiC epitaxial films
Takako Yamashita, Hirofumi Matsuhata, T. Naijo et al. · Journal of Crystal Growth · 2016 · 12 citations
Materials Engineering, Prismatic Planes, Semiconductor Technology +11
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