Concepedia

T. Naijo

TN

5

Publications

96

Citations

5

H-Index

2015

Active since

Affiliations

Toray Industries, Inc. (Japan)(Current)

Showa Denko (Japan)

National Institute of Advanced Industrial Science and Technology

T. Naijo is an author at Toray Industries, Inc. (Japan) specializing in applied physics, engineering, and materials engineering.

Top concepts

EngineeringApplied PhysicsMaterials EngineeringElectrical EngineeringCrystalline DefectsStructural AnalysisPhysicsThin FilmsMicrostructureSolid Mechanics

Publications per year

2015–2018

5

Publications

5

Origin analysis of expanded stacking faults by applying forward current to 4H-SiC p–i–n diodes

Shohei Hayashi, T. Naijo, Tamotsu Yamashita et al. · Applied Physics Express · 2017 · 28 citations

Semiconductor Technology, Electrical Engineering, Origin Analysis +14

Structural analysis of double-layer Shockley stacking faults formed in heavily-nitrogen-doped 4H-SiC during annealing

Yuichiro Tokuda, Takako Yamashita, I. Kamata et al. · Journal of Applied Physics · 2017 · 26 citations

Materials Science, Engineering, Expansion Behavior +13

Characterization of double Shockley-type stacking faults formed in lightly doped 4H-SiC epitaxial films

Takako Yamashita, Shohei Hayashi, T. Naijo et al. · Journal of Crystal Growth · 2018 · 16 citations

Materials Engineering, Electrical Engineering, Engineering +6

Characteristic morphologies of triangular defects on Si-face 4H-SiC epitaxial films

Takako Yamashita, T. Naijo, Hirofumi Matsuhata et al. · Journal of Crystal Growth · 2015 · 14 citations

Materials Engineering, Electrical Engineering, Engineering +6

Structural analysis of the 3C|4H boundaries formed on prismatic planes in 4H-SiC epitaxial films

Takako Yamashita, Hirofumi Matsuhata, T. Naijo et al. · Journal of Crystal Growth · 2016 · 12 citations

Materials Engineering, Prismatic Planes, Semiconductor Technology +11

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