Erik R. Hosler

Ultraintense X-Ray Induced Ionization, Dissociation, and Frustrated Absorption in Molecular Nitrogen

M. Hoener, L. Fang, Oleg Kornilov et al. · Physical Review Letters · 2010 · 204 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +19

Characterization of vibrational wave packets by core-level high-harmonic transient absorption spectroscopy

Erik R. Hosler, Stephen R. Leone · Physical Review A · 2013 · 63 citations

Engineering, Absorption Spectroscopy, Electronic Excited State +16

Considerations for a free-electron laser-based extreme-ultraviolet lithography program

Erik R. Hosler, Obert R. Wood, William A. Barletta et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2015 · 26 citations

Accelerator Technology, Free-electron Lasers, Electrical Engineering +13

Sensitivity analysis and line edge roughness determination of 28-nm pitch silicon fins using Mueller matrix spectroscopic ellipsometry-based optical critical dimension metrology

Dhairya Dixit, Samuel O’Mullane, Sravan Sunkoju et al. · Journal of Micro/Nanolithography MEMS and MOEMS · 2015 · 23 citations · Full text

Mueller Matrix, Optical Materials, Engineering +20

Optical critical dimension metrology for directed self-assembly assisted contact hole shrink

Dhairya Dixit, Avery Green, Erik R. Hosler et al. · Journal of Micro/Nanolithography MEMS and MOEMS · 2016 · 20 citations