Byoung-Don Kang

Characterization of Tantalum Nitride Thin Films Deposited on SiO[sub 2]∕Si Substrates Using dc Magnetron Sputtering for Thin Film Resistors

Nguyễn Duy Cường, Dong-Jin Kim, Byoung-Don Kang et al. · Journal of The Electrochemical Society · 2006 · 45 citations

Materials Science, Materials Engineering, Thin Film Physics +15

Characterizations of high resistivity TiNxOy thin films for applications in thin film resistors

Nguyễn Duy Cường, Dong-Jin Kim, Byoung-Don Kang et al. · Microelectronics Reliability · 2007 · 37 citations

Materials Science, Electrical Engineering, Engineering +7

Effect of the deposition temperature on temperature coefficient of resistance in CuNi thin film resistors

Sung-Gi Hur, Dong-Jin Kim, Byoung-Don Kang et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2004 · 35 citations

Materials Science, Electrical Engineering, Tcr Value +15

Effect of Chromium Concentration on the Electrical Properties of NiCr Thin Films Resistor Deposited at Room Temperature by Magnetron Cosputtering Technique

Nguyen Mai Phuong, Dongjin Kim, Byoung-Don Kang et al. · Journal of The Electrochemical Society · 2005 · 27 citations

Nicr Films, Engineering, Chemistry +17

Structural and electrical characterization of tantalum nitride thin film resistors deposited on AlN substrates for π-type attenuator applications

Nguyễn Duy Cường, Dong-Jin Kim, Byoung-Don Kang et al. · Materials Science and Engineering B · 2006 · 23 citations

Materials Science, Aluminium Nitride, Electrical Engineering +11