Michael Van Buskirk

Conductive-bridge memory (CBRAM) with excellent high-temperature retention

John R. Jameson, Paul T. Blanchard, Chiyu Cheng et al. · 2013 · 74 citations

Natural Sciences, Materials Science, Physics +15

An investigation of erase-mode dependent hole trapping in flash EEPROM memory cell

S. Haddad, Chih‐Yung Chang, Annie G. Wang et al. · IEEE Electron Device Letters · 1990 · 59 citations

Engineering, Computer Engineering, Electrical Engineering +17

Vertical double gate Z-RAM technology with remarkable low voltage operation for DRAM application

Joong-Sik Kim, Sung-Woong Chung, Tae-Su Jang et al. · 2010 · 12 citations

Engineering, Electrical Engineering, Memory +8

Virtual-ground sensing techniques for a 49-ns/200-MHz access time 1.8-V 256-Mb 2-bit-per-cell flash memory

Binh Le, M. Achter, Chin Ghee Chng et al. · IEEE Journal of Solid-State Circuits · 2004 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +15