W. K. Tice - Concepedia

Author

W. K. Tice

IBM (United States)

Also Known As

Tice, W. K., W Tice, W. K. TICE, W. K. Tice, W. Tice, WARREN K. TICE, Warren K. Tice

Publications

862

Citations

H-Index

Concepts

All Affiliations

IBM (United States)Hartford Financial Services (United States)United Aircraft (Russia)

About

W. K. Tice is an author at IBM (United States) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	13	832
2	Applied Physics	11	12	811
3	Chemistry	2	2	116
4	Natural Sciences	1	1	103
5	Chemical Engineering	1	1	10

W. K. Tice

Publications

832

Citations

H-Index

Page 1

	Year	Citations
Intrinsic gettering by oxide precipitate induced dislocations in Czochralski Si T. Y. Tan, E.E. Gardner, W. K. Tice Applied Physics Letters Materials EngineeringMaterials ScienceEngineeringDislocation InteractionIntrinsic Impurity	1977	388
Oxygen precipitation and the generation of dislocations in silicon T. Y. Tan, W. K. Tice Philosophical magazine EngineeringAbstract Oxygen-rich PrecipitatesCrystalline DefectsDislocation InteractionMechanics	1976	173
Nucleation of CuSi precipitate colonies in oxygen-rich silicon W. K. Tice, T. Y. Tan Applied Physics Letters Materials ScienceMaterials EngineeringCusi Precipitate ColoniesEngineeringDislocation Interaction	1976	103
Critical microstructure for ion-implantation gettering effects in silicon H.J. Geipel, W. K. Tice Applied Physics Letters Materials ScienceXe ImplantationIon ImplantationCritical MicrostructureEngineering	1977	26
Circular stacking faults in silicon W. K. Tice, Ting C. Huang Applied Physics Letters Defect ToleranceFrank DislocationEngineeringDislocation InteractionPhysics	1974	24
Creep behavior of Al-Al3Ni eutectic composites E. M. Breinan, E.R. Thompson, W. K. Tice Metallurgical Transactions Materials ScienceMaterials EngineeringEngineeringHigh-performance MaterialMaterial Performance	1972	21
Nucleation of stacking faults at oxide precipitate-dislocation complexes in silicon T. Y. Tan, Lin Wu, W. K. Tice Applied Physics Letters Materials ScienceOxide Precipitate-dislocation ComplexesEngineeringDislocation InteractionCrystalline Defects	1976	20
Reduction of Leakage by Implantation Gettering in VLSI Circuits H.J. Geipel, W. K. Tice IBM Journal of Research and Development EngineeringIntegrated CircuitsDefect ToleranceInterconnect (Integrated Circuits)Ion Implantation	1980	17
Precipitation of Oxygen and Intrinsic Gettering in Silicon W. K. Tice, T. Y. Tan MRS Proceedings Materials ScienceMaterials EngineeringSinteringEngineeringIntrinsic Gettering	1980	14
Growth of Lithium Fluoride and Magnesium Oxide Whiskers in the Electron Microscope C. O. Hulse, W. K. Tice Nature Materials ScienceEngineeringMagnesium Oxide WhiskersElectron MicroscopyLi-ion Battery Materials	1965	13

Page 1