W.A. Klaasen

Three dimensional devices fabricated by silicon epitaxial lateral overgrowth

G.W. Neudeck, Peter J. Schubert, J. L. Glenn et al. · Journal of Electronic Materials · 1990 · 25 citations

Engineering, Materials Engineering, Materials Science +14

High-reliability fault-tolerant 16-MBit memory chip

C.H. Stapper, J.A. Fifield, H.L. Kalter et al. · IEEE Transactions on Reliability · 1993 · 21 citations

Engineering, Computer Engineering, Electrical Engineering +17

Selective epitaxial growth silicon bipolar transistors for material characterization

J. Siekkinen, W.A. Klaasen, G.W. Neudeck · IEEE Transactions on Electron Devices · 1988 · 20 citations

Engineering, Electrical Engineering, Materials Science +17

Sidewall gate controlled diode for the measurement of silicon selective epitaxial growth-SiO/sub 2/ interface defects

W.A. Klaasen, G.W. Neudeck · IEEE Transactions on Electron Devices · 1990 · 12 citations

Engineering, Electrical Engineering, Materials Science +16