S. Joumori

Composition, chemical structure, and electronic band structure of rare earth oxide/Si(1 0 0) interfacial transition layer

Takanori Hattori, T. Yoshida, Tomohiro Shiraishi et al. · Microelectronic Engineering · 2004 · 87 citations

Materials Science, Ii-vi Semiconductor, Rare Earth Mineral +9

High-resolution RBS: a powerful tool for atomic level characterization

Kenji Kimura, S. Joumori, Y. Oota et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2004 · 64 citations

Engineering, Physics, Atomic Emission Spectroscopy +8

Strain profiling of HfO2/Si(001) interface with high-resolution Rutherford backscattering spectroscopy

K. Nakajima, S. Joumori, Motofumi Suzuki et al. · Applied Physics Letters · 2003 · 27 citations

Materials Science, Strain Depth Profiles, Epitaxial Growth +15

Atomic-scale depth profiling of composition, chemical structure and electronic band structure of La2O3/Si(1 0 0) interfacial transition layer

Hiroshi Nohira, Tomohiro Shiraishi, Kazutoshi Takahashi et al. · Applied Surface Science · 2004 · 26 citations

Materials Science, Epitaxial Growth, Engineering +10