Yu‐Zhe Zheng

Analysis of Negative Bias Temperature Instability Degradation in p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistors of Different Grain Sizes

Hong‐Yi Tu, Tsung‐Ming Tsai, Chia‐Chuan Wu et al. · IEEE Electron Device Letters · 2019 · 33 citations

Engineering, Electrical Engineering, Materials Science +15

Systematic Analysis of High-Current Effects in Flexible Polycrystalline-Silicon Transistors Fabricated on Polyimide

Bo‐Wei Chen, Hsin-Lu Chen, Ting‐Chang Chang et al. · IEEE Transactions on Electron Devices · 2017 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

Effect of SiO₂ Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on Polyimide

Bo‐Wei Chen, Ting‐Chang Chang, Yu-Ju Hung et al. · IEEE Electron Device Letters · 2016 · 20 citations

Engineering, Electrical Engineering, Materials Science +17

Investigation of Thermal Behavior on High-Performance Organic TFTs Using Phase Separated Organic Semiconductors

Yang‐Hao Hung, Ting‐Chang Chang, Yu‐Zhe Zheng et al. · IEEE Electron Device Letters · 2021 · 12 citations

Natural Sciences, Materials Engineering, Materials Science +17

Abnormal Two-Stage Degradation on P-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistor Under Hot Carrier Conditions

Hong‐Yi Tu, Ting‐Chang Chang, Yu‐Ching Tsao et al. · IEEE Electron Device Letters · 2022 · 10 citations

Engineering, Electrical Engineering, Materials Science +17