Concepedia

R.B. Fair

RF

Statistics

Publications

3

Citations

231

H-Index

3

Active since

1981

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

R.B. Fair is an author at IBM Research - Thomas J. Watson Research Center specializing in engineering, microelectronics, and applied physics.

Top concepts

EngineeringApplied PhysicsMicroelectronicsElectrical EngineeringPhysicsOptoelectronic DevicesPulse PowerSemiconductorsNanoelectronicsSurface Science

Publications per year

1981–1999

3

Publications

3

Threshold-voltage instability in MOSFET's due to channel hot-hole emission

R.B. Fair, Ruizhe Sun · IEEE Transactions on Electron Devices · 1981 · 185 citations

Semiconductor Technology, Mosfet Channel, Electrical Engineering +15

Suppression of boron transport out of p+ polycrystalline silicon at polycrystalline silicon dielectric interfaces

Yi Wu, H. Niimi, Hong Yang et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 31 citations

Engineering, Boron Transport, Optoelectronic Devices +18

Fully scaled 0.5 μm metal–oxide semiconductor circuits by synchrotron x-ray lithography: Mask fabrication and characterization

R. Viswanathan, R. E. Acosta, David E. Seeger et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1988 · 15 citations

Engineering, Electron-beam Lithography, X-ray Masks +21

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