W VANDERVORST

Characterization of electrically active dopant profiles with the spreading resistance probe

Trudo Clarysse, Danielle Vanhaeren, I. Hoflijk et al. · Materials Science and Engineering R Reports · 2004 · 54 citations

Engineering, Electrical Engineering, Materials Science +14

Damage accumulation and dopant migration during shallow As and Sb implantation into Si

M. Werner, D.G. Armour, W VANDERVORST et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2003 · 21 citations · Full text

Engineering, Electrical Engineering, Materials Engineering +12

Incorporation of a Resistivity‐Dependent Contact Radius in an Accurate Integration Algorithm for Spreading Resistance Calculations

Robert Piessens, W VANDERVORST, H.E. Maes · Journal of The Electrochemical Society · 1983 · 13 citations

Engineering, Electrical Engineering, Circuit Theory +11