Dariusz Czysz

Low Power Scan Shift and Capture in the EDT Environment

Dariusz Czysz, Mark Kassab, Xijiang Lin et al. · 2008 · 57 citations

Engineering, Test Compression Environment, Computer Architecture +20

Low-Power Scan Operation in Test Compression Environment

Dariusz Czysz, Mark Kassab, Xijiang Lin et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2009 · 56 citations

Hardware Security, Power-aware Design, Electrical Engineering +15

New test data decompressor for low power applications

Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz et al. · Proceedings - ACM IEEE Design Automation Conference · 2007 · 52 citations

Low Power Applications, Minimal Hardware Modification, Engineering +17

Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression

Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2011 · 47 citations

Engineering, Test Data Generation, Software Engineering +21

On Compaction Utilizing Inter and Intra-Correlation of Unknown States

Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2009 · 35 citations

Unknown State Profiles, Engineering, X States +13