Chunhyung Jo

Single-Scan Monochromatic Photonic Capacitance-Voltage Technique for Extraction of Subgap DOS Over the Bandgap in Amorphous Semiconductor TFTs

Hagyoul Bae, Hyun-Jun Choi, Sungwoo Jun et al. · IEEE Electron Device Letters · 2013 · 52 citations

Engineering, Electrical Engineering, Materials Science +7

Unified Subthreshold Coupling Factor Technique for Surface Potential and Subgap Density-of-States in Amorphous Thin Film Transistors

Sungwoo Jun, Chunhyung Jo, Hagyoul Bae et al. · IEEE Electron Device Letters · 2013 · 37 citations

Engineering, Electrical Engineering, Materials Science +17

High performance gallium-zinc oxynitride thin film transistors for next-generation display applications

Tae Sang Kim, Hyun‐Suk Kim, Joon Seok Park et al. · 2013 · 26 citations

Engineering, Electrical Engineering, Materials Science +15

The Effect of Gate and Drain Fields on the Competition Between Donor-Like State Creation and Local Electron Trapping in In–Ga–Zn–O Thin Film Transistors Under Current Stress

Sungju Choi, Hyeongjung Kim, Chunhyung Jo et al. · IEEE Electron Device Letters · 2015 · 25 citations

Engineering, Electrical Engineering, Materials Science +13

Characterization of density-of-states and parasitic resistance in a-InGaZnO thin-film transistors after negative bias stress

Chunhyung Jo, Sungwoo Jun, Woojoon Kim et al. · Applied Physics Letters · 2013 · 17 citations

Engineering, Electrical Engineering, Materials Science +17