Concepedia

R. Nieh

RN

Statistics

Publications

36

Citations

2.8K

H-Index

27

Active since

1999

Affiliations

The University of Texas at Austin(Current)

Motorola (United States)

R. Nieh is an author at The University of Texas at Austin specializing in engineering, applied physics, and electrical engineering.

Top concepts

EngineeringApplied PhysicsElectrical EngineeringMicroelectronicsNanoelectronicsMaterial ScienceMaterials EngineeringElectrical InsulationThin FilmsSurface Science

Publications per year

1999–2003

36

Publications

36

Thermal stability and electrical characteristics of ultrathin hafnium oxide gate dielectric reoxidized with rapid thermal annealing

Byoung Hun Lee, Laegu Kang, R. Nieh et al. · Applied Physics Letters · 2000 · 605 citations

Engineering, Thin Film Process Technology, Semiconductor Device +18

Electrical characteristics of highly reliable ultrathin hafnium oxide gate dielectric

Laegu Kang, Byoung Hun Lee, Wenjie Qi et al. · IEEE Electron Device Letters · 2000 · 239 citations

Materials Science, Electrical Characteristics, Electrical Engineering +13

Electrical and reliability characteristics of ZrO2 deposited directly on Si for gate dielectric application

Wen-Jie Qi, R. Nieh, Byoung Hun Lee et al. · Applied Physics Letters · 2000 · 172 citations

Engineering, Gate Dielectric Application, Reliability Characteristics +19

Bonding states and electrical properties of ultrathin HfOxNy gate dielectrics

Chang Seok Kang, Hag-Ju Cho, Katsunori Onishi et al. · Applied Physics Letters · 2002 · 160 citations

Materials Science, Electrical Engineering, Electronic Devices +13

Ultrathin hafnium oxide with low leakage and excellent reliability for alternative gate dielectric application

Byoung Hun Lee, Laegu Kang, Wenjie Qi et al. · 2003 · 146 citations

Engineering, Reliability Characteristics, Semiconductor Device +16

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