Yoshio Yanase - Concepedia

Author

Yoshio Yanase

Sumco Corporation (Japan)

Also Known As

Y. Yanase, Yoshio Yanase

Publications

237

Citations

H-Index

Concepts

All Affiliations

Sumco Corporation (Japan)

About

Yoshio Yanase is an author at Sumco Corporation (Japan) specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	212
2	Applied Physics	7	7	212
3	Natural Sciences	1	1	37
4	Chemistry	1	1	48
5	Materials Engineering	1	1	16

Yoshio Yanase

Publications

212

Citations

H-Index

Page 1

	Year	Citations
Microstructure Observation of “Crystal-Originated Particles” on Silicon Wafers Morimasa Miyazaki, Sumio Miyazaki, Yoshio Yanase, Japanese Journal of Applied Physics EngineeringMicroscopyMicrostructure ShapeChemistrySilicon On Insulator	1995	48
Development of ultrahigh vacuum-atomic force microscopy with frequency modulation detection and its application to electrostatic force measurement Takayuki Uchihashi, Yasuhiro Sugawara, Yoshio Yanase, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyElectrostatic ForceElectron MicroscopyMicroscopy Method	1997	37
Influence of Crystal-Originated “Particle” Microstructure on Silicon Wafers on Gate Oxide Integrity Morimasa Miyazaki, Sumio Miyazaki, Takafumi Kitamura, Japanese Journal of Applied Physics Materials ScienceSilicon WafersCop MicrostructureEngineeringCrystalline Defects	1997	37
Formation of Grown-in Defects during Czochralski Silicon Crystal Growth Hideshi Nishikawa, Tadami Tanaka, Yoshio Yanase, Japanese Journal of Applied Physics Materials ScienceSemiconductorsFormation BehaviorOptical MaterialsEngineering	1997	31
Atomic Force Microscopy Observation of Si(100) Surface after Hydrogen Annealing Yoshio Yanase, Hiroshi Horie, Yoshio Oka, Journal of The Electrochemical Society EngineeringMicroscopySilicon On InsulatorHydrogen GasHydrogen Annealing	1994	24
Atomic Force Microscope Observation of the Change in Shape and Subsequent Disappearance of “Crystal-Originated Particles” after Hydrogen-Atmosphere Thermal Annealing Yoshio Yanase, Hideki Nishihata, Takashi Ochiai, Japanese Journal of Applied Physics Materials ScienceComplete Cop DisappearanceEngineeringSubsequent DisappearanceCrystalline Defects	1998	19
Dependence of Grown-in Defect Behavior on Oxygen Concentration in Czochralski Silicon Crystals Shigeru Umeno, Yoshio Yanase, Masataka Hourai, Japanese Journal of Applied Physics Interstitial Silicon AtomsEngineeringCrystal Growth TechnologyVacuum DeviceSilicon On Insulator	1999	16

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