Yasuhiro Sugawara - Concepedia

Author

Yasuhiro Sugawara

The University of Osaka

Also Known As

Michael F. Seldin, Sugawara, Yasuhiro, Y Sugawara, Y. Sugawara, Yasuhiro SUGAWARA, Yasuhiro Sugawara

Publications

Citations

H-Index

Concepts

All Affiliations

The University of Osaka Hiroshima University University of Chinese Academy of Sciences National Center for Nanoscience and Technology Olympus (Japan)

About

Yasuhiro Sugawara is an author at The University of Osaka specializing in engineering, applied physics, and microscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	15	481
2	Applied Physics	11	13	340
3	Natural Sciences	4	4	140
4	Medicine	3	3	112
5	Biomedical Engineering	1	1	20

Yasuhiro Sugawara

Publications

712

Citations

H-Index

Page 1

	Year	Citations
Laboratory growth of sector zoned clinopyroxenes in the system CaMgSi2O6-CaTiAl2O6 Akira Kouchi, Yasuhiro Sugawara, Katsunori Kashima, Contributions to Mineralogy and Petrology Laboratory GrowthChemical EngineeringChemistry	1983	117
Stable operation mode for dynamic noncontact atomic force microscopy H. Ueyama, Yasuhiro Sugawara, Syunsuke MORITA Applied Physics A EngineeringPhysicsMicroscopyMechanicsMicrofabrication	1998	104
Low-temperature noncontact atomic-force microscope with quick sample and cantilever exchange mechanism Nobuhito Suehira, Y. Tomiyoshi, Yasuhiro Sugawara, Review of Scientific Instruments Optical MaterialsEngineeringMicroscopyOptomechanicsCantilever Exchange Mechanism	2001	52
Effects of humidity and tip radius on the adhesive force measured with atomic force microscopy Yasuhiro Sugawara, Makoto Ohta, T. Konishi, Wear Materials ScienceAtomic Force MicroscopyEngineeringAdhesive ForceMechanics	1993	48
Atomic resolution imaging of InP(110) surface observed with ultrahigh vacuum atomic force microscope in noncontact mode Yasuhiro Sugawara, Masumi Ohta, H. Ueyama, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyNoncontact ModeElectron MicroscopyMicroscopy Method	1996	44
A hand-held magnetometer based on an ensemble of nitrogen-vacancy centers in diamond Doudou Zheng, Zongmin Ma, Weijun Guo, Journal of Physics D Applied Physics	2020	43
Lateral force curve for atomic force/lateral force microscope calibration Satoru Fujisawa, Eigo Kishi, Yasuhiro Sugawara, Applied Physics Letters EngineeringMicroscopyMeasurementVertical Force CurveMechanical Engineering	1995	40
Development of ultrahigh vacuum-atomic force microscopy with frequency modulation detection and its application to electrostatic force measurement Takayuki Uchihashi, Yasuhiro Sugawara, Yoshio Yanase, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena EngineeringMicroscopyElectrostatic ForceElectron MicroscopyMicroscopy Method	1997	37
Heterodyne technique in photoinduced force microscopy with photothermal effect Junsuke Yamanishi, Yoshitaka Naitoh, Y. J. Li, Applied Physics Letters Photothermal VibrationPhysicsPhotochemistryMicroscopySpectroscopy	2017	32
Correlation of frequency shift discontinuity to atomic positions on a Si(111)7 × 7 surface by noncontact atomic force microscopy Seizo Morita, Yasuhiro Sugawara, Kousuke Yokoyama, Nanotechnology EngineeringMicroscopyFrequency Shift DiscontinuitySilicon On InsulatorAtomic Scale	2000	27

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