A Global-Shutter CMOS Image Sensor With Readout Speed of 1-Tpixel/s Burst and 780-Mpixel/s Continuous

Yasuhisa Tochigi, Katsuhiko Hanzawa, Yuri Kato, +7

IEEE Journal of Solid-State Circuits

1-Tpixel/s BurstPhotonics780-Mpixel/s ContinuousPinned Photodiode ProcessEngineering +13

Atomically Flat Silicon Surface and Silicon/Insulator Interface Formation Technologies for (100) Surface Orientation Large-Diameter Wafers Introducing High Performance and Low-Noise Metal–Insulator–Silicon FETs

Rihito Kuroda, Tomoyuki Suwa, Akinobu Teramoto, +3

IEEE Transactions on Electron Devices

EngineeringSilicon On InsulatorSemiconductor DeviceSemiconductorsWafer Scale Processing +16

HDR CMOS Image Sensors for Automotive Applications

Isao Takayanagi, Rihito Kuroda

IEEE Transactions on Electron Devices

EngineeringCalibrationHdr TechnologyImage ProcessorHdr Image Capture +6

Revolutional Progress of Silicon Technologies Exhibiting Very High Speed Performance Over a 50-GHz Clock Rate

T. Ohmi, Akinobu Teramoto, Rihito Kuroda, +1

IEEE Transactions on Electron Devices

EngineeringVlsi DesignInsulator FilmsSemiconductor MaterialsIntegrated Circuits +18

Scanning tunneling microscope images of fatty acid Langmuir–Blodgett bilayers

Rihito Kuroda, E. Kishi, Akihito Yamano, +4

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

EngineeringTunneling MicroscopyPhysicochemical AnalysisSurface ChemistryMicroscopy +12

An Over 120 dB Single Exposure Wide Dynamic Range CMOS Image Sensor With Two-Stage Lateral Overflow Integration Capacitor

Yasuyuki Fujihara, Maasa Murata, Shota Nakayama, +2

IEEE Transactions on Electron Devices

Mixed-signal Integrated Circuit120-Db Dynamic RangeMeasured SnrTwo-stage LoficImage Sensor

Influence of silicon wafer surface roughness on semiconductor device characteristics

Keiichiro Mori, Shuichi Samata, Noritomo Mitsugi, +5

Japanese Journal of Applied Physics

Electrical EngineeringSemiconductor DeviceEngineeringWafer Scale ProcessingMicrofabrication +13

Over 100 Million Frames per Second 368 Frames Global Shutter Burst CMOS Image Sensor with Pixel-wise Trench Capacitor Memory Array

Manabu Suzuki, Yuki Sugama, Rihito Kuroda, +1

Sensors

Event CameraMillion FramesEngineeringDouble SamplingSi Trench Capacitors +5

A dead-time free global shutter CMOS image sensor with in-pixel LOFIC and ADC using pixel-wis e connections

Hidetake Sugo, Shunichi Wakashima, Rihito Kuroda, +6

Global ShutterEngineeringTime-of-flight CameraMixed-signal Integrated CircuitPrototype Chip +6

A High Near-Infrared Sensitivity Over 70-dB SNR CMOS Image Sensor With Lateral Overflow Integration Trench Capacitor

Maasa Murata, Rihito Kuroda, Yasuyuki Fujihara, +7

IEEE Transactions on Electron Devices

Developed CisPhotoelectric SensorEngineeringHealth SciencesInfrared Sensor +13