Xiren Miao

Stacked nanosheet gate-all-around transistor to enable scaling beyond FinFET

N. Loubet, Terence B. Hook, P. Montanini et al. · 2017 · 939 citations

Engineering, Nanocomputing, Semiconductor Device +17

Insulator Detection in Aerial Images for Transmission Line Inspection Using Single Shot Multibox Detector

Xiren Miao, Xinyu Liu, Jing Chen et al. · IEEE Access · 2019 · 195 citations · Full text

Image Classification, Convolutional Neural Network, Image Analysis +15

A 7nm FinFET technology featuring EUV patterning and dual strained high mobility channels

Ruijie Xie, P. Montanini, Kerem Akarvardar et al. · 2016 · 139 citations

Engineering, Electron-beam Lithography, Finfet Technology +18

Insulator Fault Detection in Aerial Images Based on Ensemble Learning With Multi-Level Perception

Hao Jiang, Xiaojie Qiu, Jing Chen et al. · IEEE Access · 2019 · 114 citations · Full text

Fault Diagnosis, Engineering, Machine Learning +21

Full Bottom Dielectric Isolation to Enable Stacked Nanosheet Transistor for Low Power and High Performance Applications

J. Zhang, Julien Frougier, Andrew Greene et al. · 2019 · 93 citations

Engineering, Semiconductor Device, Advanced Packaging (Semiconductors) +17