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Publications
2
Citations
63
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Active since
2011
Syahirah Zulkifli is an author specializing in device reliability, microelectronics, and semiconductor reliability.
Publications per year
2011–2017
Fault isolation in semiconductor product, process, physical and package failure analysis: Importance and overview
Jiann Min Chin, Vinod Narang, Xiaole Zhao et al. · Microelectronics Reliability · 2011 · 35 citations
Engineering, Computer Engineering, Electrical Engineering +16
High-res 3D X-ray microscopy for non-destructive failure analysis of chip-to-chip micro-bump interconnects in stacked die packages
Syahirah Zulkifli, Bemice Zee, Wen Qiu et al. · 2017 · 28 citations
Engineering, Electrical Engineering, Materials Science +17
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