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Publications
1
Citations
28
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Active since
2017
Bemice Zee is an author specializing in microelectronics, non-destructive inspection, and microscopy.
Publications per year
2017–2017
High-res 3D X-ray microscopy for non-destructive failure analysis of chip-to-chip micro-bump interconnects in stacked die packages
Syahirah Zulkifli, Bemice Zee, Wen Qiu et al. · 2017 · 28 citations
Engineering, Electrical Engineering, Materials Science +17
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