Statistics
Publications
4
Citations
59
H-Index
4
Active since
1998
Affiliations
Nova Measuring Instruments (Israel)(Current)
Shay Wolfling is an author at Nova Measuring Instruments (Israel) specializing in natural sciences, optical interferometry, and semiconductor metrology.
Publications per year
1998–2021
4
4
Daniel Schmidt, Curtis Durfee, S. Pancharatnam et al. · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV · 2021 · 11 citations
Engineering, Electrical Engineering, Materials Engineering +17
1–4 of 4