Statistics
Publications
10
Citations
302
H-Index
10
Active since
2016
Xiaoli Tian is an author at Institute of Microelectronics specializing in microelectronics, engineering, and electrical engineering.
Publications per year
2016–2024
10
10
A Novel 4H-SiC Trench MOSFET Integrated With Mesa-Sidewall SBD
Zhonglin Han, Yun Bai, Hong Chen et al. · IEEE Transactions on Electron Devices · 2020 · 32 citations
Analysis of Gate Oxide Degradation Induced by Heavy Ion in SiC Power MOSFETs
Leshan Qiu, Yun Bai, Jieqin Ding et al. · IEEE Transactions on Electron Devices · 2024 · 17 citations
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