10
Publications
302
Citations
10
H-Index
2016
Active since
Xiaoli Tian is an author at Institute of Microelectronics specializing in microelectronics, engineering, and electrical engineering.
Top concepts
EngineeringMicroelectronicsElectrical EngineeringApplied PhysicsPower ElectronicsNanoelectronicsSingle Event EffectsThermodynamicsOptoelectronicsSurface Science
Publications per year
2016–2024
10
10
A Novel 4H-SiC Trench MOSFET Integrated With Mesa-Sidewall SBD
Zhonglin Han, Yun Bai, Hong Chen et al. · IEEE Transactions on Electron Devices · 2020 · 32 citations
Analysis of Gate Oxide Degradation Induced by Heavy Ion in SiC Power MOSFETs
Leshan Qiu, Yun Bai, Jieqin Ding et al. · IEEE Transactions on Electron Devices · 2024 · 17 citations
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