Huixiang Huang

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

Chao Peng, Zhiyuan Hu, Bingxu Ning et al. · IEEE Electron Device Letters · 2014 · 41 citations

Engineering, Electrical Engineering, Radiation Physics +16

Bias dependence of TID radiation responses of 0.13μm partially depleted SOI NMOSFETs

Bingxu Ning, Dawei Bi, Huixiang Huang et al. · Microelectronics Reliability · 2012 · 29 citations

Engineering, Electrical Engineering, Microelectronics +14

Progressive attention integration-based multi-scale efficient network for medical imaging analysis with application to COVID-19 diagnosis

Tingyi Xie, Zidong Wang, Han Li et al. · Computers in Biology and Medicine · 2023 · 16 citations · Full text

Medicine, Biomedical Engineering, Biomedical Informatics +9

Improving Total Dose Tolerance of Buried Oxides in SOI Wafers by Multiple-Step <formula formulatype="inline"><tex Notation="TeX">${\hbox {Si}}^ + $</tex></formula> Implantation

Huixiang Huang, Dawei Bi, Ming Chen et al. · IEEE Transactions on Nuclear Science · 2014 · 15 citations

Engineering, Electrical Engineering, Materials Science +16

Total ionizing dose effect in 0.2μm PDSOI NMOSFETs with shallow trench isolation

Chao Peng, Zhiyuan Hu, Zhengxuan Zhang et al. · Microelectronics Reliability · 2014 · 12 citations

Engineering, Electrical Engineering, Microelectronics +12