J.G. Cottle

Activation energies associated with current noise of thin metal films

J.G. Cottle, T. M. Chen · Journal of Electronic Materials · 1988 · 21 citations

Natural Sciences, Materials Engineering, Materials Science +13

A comparison between noise measurements and conventional electromigration reliability testing

J.G. Cottle, T.M. Chen, Kenneth P. Rodbell · 2003 · 13 citations

Engineering, Electrical Engineering, Materials Science +17

1/f/sup alpha / noise and fabrication variations of TiW/Al VLSI interconnections

J.G. Cottle, N. S. Klonaris, M. Bordelon · IEEE Electron Device Letters · 1990 · 13 citations

Engineering, Electrical Engineering, Materials Science +17

Microstructural effects on the 1/f α noise of thin aluminum based films

J.G. Cottle, N. S. Klonaris · Journal of Electronic Materials · 1990 · 12 citations

Natural Sciences, Materials Engineering, Materials Science +14

Physical model of burst noise in thick-film resistors

T.M. Chen, J.G. Cottle · Solid-State Electronics · 1986 · 10 citations

Engineering, Electrical Engineering, Physics +16